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K72

27th. meeting of the Department of Nanometrology

Date: 14.11.2019

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We would like to invite you to the meeting of the Department of Nanometrology, which will be held on 15.11.2019 at 10:15 in room 203 of building C-2.

During the meeting a lecture about using the AFM techniques for observation of changes in surface properties in the sub-micron scale, will be delivered by Andzej Sikora, PhD, Eng..

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