Inside the vacuum chamber of a scanning electron microscope with focused ion beam, the field emission phenomenon from a nanowire was recorded. The nanowire was fabricated in FEBID process – electron beam induced deposition - from Pt(C) material, that is, platinum nanograins immersed in a carbon matrix. The electronic device has been deposited on microcantilevers manufactured in the cooperating Institute of Microelectronics and Photonics in Warsaw. In the Department of Nanometrology, research is being carried out to use nanoemitters as detectors of microcantilevers deflection, in particular due to acting photon force. Deflection of the microstructures will be monitored by variation of the distance between the electrodes. The research is conducted within the OPUS grant “Nottingham effect nanometrology guided by operational micro-electromechanical systems” (no. 2020/37/B/ST7/0, founding source: The National Science Centre).