We invite you to listen to the lectures as part of the "School on Scanning Probe Microscopy", which will be held on September 16-18. One of the speakers will be a member of our Department, Andrzej Sikora. He will deliver two lectures:

September 16 at 11:45: "The utilization of fast AFM's tip-sample interaction for the surface morphology imaging and mechanical properties mapping".

September 17 at 14:00: "Correlative microscopy - the issue of precise positioning of the sample and its impact on the experiment outcome".

Participation in the lectures is completely free.

We invite you to participate.

https://www.nanoinnovation2020.eu/home/index.php/programme/schools-and-courses/nanoinnovation-spm-school