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K72

Meeting of Committee on Metrology and Research Equipment

Date: 24.10.2018

Today our Group hosted plenary session of Committee on Metrology and Research Equipment  Polish Academy of Sciences
(KMiAN PAN, http://www.kmian.pan.pl).

One point of the Agenda was a guided-tour around our laboratories:
– Laboratory of X-Ray diffractometry,
– Laboratory of FIB/SEM microscopy,
– Laboratory of metrology of MEMS/NEMS devices,
– Laboratories of atomic force microscopy,
– Laboratories of optoelectronics & fibre optic technology,
– Laboratory of electrical characterization of materials,
– Laboratory of semiconductor, dielectric and magnetic materials characterization (students' lab)
– Laboratory of DLTS.

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