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Congratulations to the authors of the publication: K. Moszak, W. Olszewski, D. Pucicki, J. Serafińczuk, K. Opołczyńska, M. Rudziński, R. Kudrawiec, and D. Hommel
“Verification of threading dislocations densitye stimation methods suitable for efficient structural characterization of AlxGa1-xN/GaN heterostructures grown by MOVPE” in the Journal of Applied Physics of the American Institute of Physics (IF = 2.3).