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Congratulations to the authors of the publication: B. Świadkowski, T. Piasecki, M. Rudek, M. Świątkowski, K. Gajewski, W. Majstrzyk, M. Babij, A. Dzierka, T. Gotszalk
„ARMScope – the versatile platform for scanning probe microscopy systems” in Metrology and Measurement Systems (IF=1.1).