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K72

Publication of the Department of Nanometrology in Metrology and Measurement Systems

Date: 04.04.2020

Congratulations to the authors of the publication: K. Orłowska, M. Mognaschi, K. Kwoka, T. Piasecki, P. Kunicki, A. Sierakowski, W. Majstrzyk, A. Podgórni, B. Pruchnik, P. di Barba, T. Gotszalk.

“A method of magnetic field measurement in a scanning electron microscope using a microcantilever magnetometer” in Metrology and Measurement Systems (IF=0,9)

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