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On 16-18th September 2020 took place School on Scanning Probe Microscopy as a part of NanoInnovation 2020 Conference. Event was organized in hybrid form – speakers lectured in Sapienza University of Rome and also online. Whole conference was transmitted via Zoom platform.
During conference we had pleasure to hear two lectures from prof. Andrzej Sikora: „The utilization of fast AFM’s tip-sample interaction for the surface morphology imaging and mechanical properties mapping” and „Correlative microscopy – the issue of precise positioning of the sample and its impact on the experiment outcome”.
The lectures enjoyed great interest. We would like congratulate prof. Andrzej Sikora and wish him further success in his future endeavour.
